“Super Accelerated Examination System”, a pilot programme of Japanese Patent Office was launched on 1st October, 2008 to process the patent applications at a faster pace than what is already done under the conventional accelerated examination system. The first ever patent granted under this super accelerated examination system was filed by Keio University. The request for examination for this application was made on 1st October, 2008 and the patent was granted in 17 days from the said request for examination.
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